X-ray diffraction measurement using a 2D detector
XRD: X-ray diffraction method
When measurements are conducted using a two-dimensional detector, information about the diffraction angle (2θ) as well as the tilt direction (χ) can be obtained simultaneously. The observed two-dimensional diffraction pattern can visualize characteristics such as the crystallinity and orientation of the material, making it effective for evaluating materials where orientation affects their properties.
- 企業：一般財団法人材料科学技術振興財団 MST
- 価格：Other
